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Instrument and meter
ADR low-temperature constant temperature dry mK system
Precision glass cutting machine (desktop type)
Laser sampling
LAVIDA Paraxylene Coating Equipment
Atomic layer deposition system ALD products
Electron microscope sample cleaning machine
Laser interference lithography machine
COWIN High Throughput Integrated Plasma Reaction Ion Etching Cleaning System
Nano observer electrical atomic force microscope
Optical surface defect analyzer
Desktop Pro Thin Film Deposition - Magnetron Sputtering
NX Wafer Fully Automated Wafer Inspection Atomic Force Microscope
Explorer Electron Beam, Magnetron, Thermal Evaporation Thin Film Deposition
DV-502 Thermal Evaporation Thin Film Deposition
P17 automatic wafer probe profilometer/stair step meter
Internal stress detector
NX-HDM fully automatic defect detection atomic force microscope
Cathodic Fluorescence Imaging Spectral Detection System
NX-3DM Rotating Fully Automatic Atomic Force Microscope
Freeform Surface 3D Shape Tester
Wafer warpage stress measuring instrument
Desk V Thin Film Deposition Solution
BenchTop Turbo Thermal Evaporation and Sample Preparation
Hyperspectral microscope
Multi functional maskless laser direct writing
Successful operation!
