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Product details
Electron microscope energy spectrum integrated machine
brief introduction
The electron microscopy energy dispersive spectrometer is the ultimate integrated imaging analysis system, with a resolution increase of 20%, further expanding its application range and making it more suitable for samples sensitive to electron beams. With the help of this system, it is possible to observe the surface morphology of the sample and analyze its elemental composition.
When studying samples, obtaining morphological information of the samples only solves half of the problem. Obtaining information on the elemental composition of the sample is often essential. With the help of fully integrated and specially designed energy spectrum detectors, the electron microscope energy spectrum integrated machine can comprehensively solve all the above problems.
An energy spectrometer is an analytical instrument that generates X-rays based on the excitation of a sample by an electron beam. The energy spectrometer, both in terms of software and hardware, is fully integrated into the electron microscope energy spectrometer system.
The software enables users to perform multi-point analysis and detect the elemental components of samples. In addition, the software can also be extended to elemental analysis line scan function. The step-by-step operation interface can help users collect and export analysis data more conveniently.
Specification parameters
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Phenom Pro
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Phenom ProX
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Phenom XL
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Optical amplification
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20 - 135 X
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20 - 135 X
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3 - 16 X
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Electron optical amplification
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80 - 150,000 X
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80 - 150,000 X
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80 - 100,000 X
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resolving power
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Better than 8 nm
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Better than 8 nm
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Better than 14 nm
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Digital amplification
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Max. 12 X
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Max. 12 X
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Max. 12 X
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Optical navigation camera
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colour
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colour
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colour
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Acceleration voltage
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5 kV -15 kV continuously adjustable
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5 kV -15 kV continuously adjustable
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5 kV -20 kV continuously adjustable
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Vacuum mode
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High resolution mode
Reduce the mode of charge effect
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High resolution mode
Reduce the mode of charge effect
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High resolution mode
Reduce the mode of charge effect
High vacuum mode
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detector
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Backscattered electron detector
Secondary electronic detector (optional)
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Backscattered electron detector
Secondary electronic detector (optional)
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Backscattered electron detector
Secondary electronic detector (optional)
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High cost-effective standard versionscanning electron microscope
brief introduction
The high cost-effective standard version is a user-friendly and user-friendly interfacesimple and easyThe desktop electron microscope can be easily operated by users of conventional optical microscopes with minimal training. This electron microscope has all the basic functions of a scanning electron microscope and can meet most of the imaging needs of users.
This electron microscope not only has high image quality, but also has the fastest sample loading and imaging speed among all electron microscopes in the industry! In addition, it also has automatic focusing and positioning functions, and the operating interface is the most advanced among all electron microscopessimple and easyThe simplest. At the same time, it is also the most economical and efficient imaging system.
Users do not need to worry about system maintenance when using it, which can maximize the running time of the electron microscope. Moreover, any employee can easily operate the electron microscope and obtain high-quality electron microscope images.
The high cost-effective standard version is an integrated portable system that is easy to transport, can be unpacked and installed for use, and does not require a computer or other accessories.
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