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XRF-1800 model
XRF-1800 model
Product details

The world's first 250 μ m micro area distribution imaging analysis function!

The XRF-1500/1700 series X-ray fluorescence spectrometer was the first in the world to develop micro area analysis/distribution analysis functions, and was the first to adopt 4KW thin window X-ray tubes, expanding the application field of X-ray fluorescence analysis. As a revolutionary instrument, it has been highly praised and has sold more than 200 units.
The scanning X-ray fluorescence spectrometer XRF-1800 has been improved in many details of its hardware and software, further enhancing its reliability and operability. It has added the world's first 250 μ m micro area distribution imaging analysis function, achieving a higher level of perfection. As a pioneer in high sensitivity and micro area analysis, Shimadzu Corporation confidently presents its excellent XRF-1800 X-ray fluorescence spectrometer to users.

·The world's first 250 μ m micro area distribution imaging analysis function in wavelength dispersive devices(Patent already obtained)

Can analyze the content distribution and intensity distribution of uneven samples.


Example of XRF-1800 imaging analysis of rare earth element ores



·Accurate qualitative/quantitative analysis using high-order spectral lines(Patent application in progress)

The determination of high-order spectral lines is more accurate, improving the accuracy/reliability of qualitative and quantitative analysis.


Example of using XRF-1800 high-order spectral lines to analyze brake pads

·Basic Background Parameters (BG-FP) Method for Determining Film Thickness and Inorganic Composition Analysis of Polymer Thin Films

Calculate the information of hydrogen (H) element that cannot be obtained by fluorescence X-ray analysis using the intensity ratio of Compton scattering/Rayleigh scattering. In the analysis of polymer thin films, the theoretical intensity of Compton scattering lines is used as information for polymer thin films.


Examples of film thickness measurement and thin film measurement using XRF-1800

·Micro area analysis structure
A specially developed sliding field of view limiting light bar with a unique shape, utilizing r-direction sliding and sample rotation control for q-rotation, can be analyzed at any position within a diameter of 30mm.

·Using a CCD camera, samples can be directly observed(Optional accessories)
Place the sample container at the position where the sample is imported into the measuring room in the same way as the measuring position. By capturing the image of the sample through CCD, the measuring position can be aligned with the image.
(Patent application in progress)

·Equipped with a high reliability and long-life 4kW thin window X-ray tube
Equipped with high reliability X-ray tubes with an average lifespan of over 5 years. Compared with traditional 3kWX X-ray tubes, the analysis sensitivity of light elements is increased by more than 2 times.

·Integrate the module function of the essence of Shimadzu's skills, and match the analysis function
Different forms of samples such as liquids, powders, solids, metals, oxides, etc. have corresponding analysis conditions, and based on this, the optimal analysis conditions can be formulated. Can be customized according to different materials
The four matching functions of judgment, variety classification, variety judgment, and consistency search are used for judgment and retrieval.



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