• XRD-6100 has an intrinsic safety structure.
• The X-ray tube can only be opened when the door chain mechanism is locked, providing high safety.Equipped with a vertical angle measuring instrument with high-speed operation (1000 °/min) and high-precision angle reproducibility (± 0.0001 °), it can measure various samples.The driving mechanism is an independent 2-axis drive, which can choose between θ -2 θ linkage or θ, 2 θ axis independent drive, especially effective for thin film measurement.
• Equipped with a wide range of accessories (software/hardware) to meet various needs.

X-ray Diffraction Device XRD-6000 Environmental Measurement Package

Suitable for qualitative and quantitative analysis of free silicon and asbestos in industrial environments.
In the Labor Safety and Health Law, it is stipulated that the determination of the working environment must be carried out for 92 substances that cause health damage to workers due to their exposure at work. Among them, the qualitative and quantitative analysis of free silicon and asbestos in dust can be carried out using X-ray diffraction equipment. Recently, due to the revision of relevant regulations, the management concentration and analysis procedures for hazardous substances have been modified.
This assay kit is equipped with a sample stage and quantitative software based on the "substrate standard absorption correction method". This is not only necessary for qualitative analysis of free silicon and asbestos collected in industrial environments on filter paper using the X-ray diffraction device XRD-6000, but also essential for quantitative analysis of these trace samples.
Qualitative and quantitative analysis of free silicon
The management concentration of mineral dust in industrial environment determination is calculated according to the following formula. (Implemented from April 1st, 2005)
E=3.0/(0.59Q+1) (Reference) Before revision, E=2.9/(0.22Q+1) E: Management concentration mg/m3 Q: Free silicon content (%)
So it is important to know the content of free silicic acid in dust.
There are various types of free silicon, such as quartz, microcrystals, and scale quartz. In this revision, it is first stipulated to use X-ray diffraction equipment to determine the type of free silicon contained (qualitative analysis), and based on its qualitative results, quantitative analysis will be carried out using the phosphoric acid method or the substrate standard absorption correction method of X-ray diffraction equipment.
The following figure shows the diffraction patterns of these free silicon, each with its own characteristic peaks, making it easy to identify their types.
The diffraction X-ray intensity of a substance must be corrected due to the influence of absorption by the substrate material. To perform calibration, it is necessary to obtain the X-ray absorption coefficient of the substrate material. The method that can complete it in one measurement is the "base standard absorption correction method". This assay package includes specialized quantitative analysis software that utilizes this substrate absorption correction method.

Diffraction modes of various free silicon

Qualitative and quantitative analysis of asbestos
Regarding asbestos, the 'Asbestos Injury Prevention Rules' were implemented in July 2005. If the asbestos content of building materials and other samples subject to this rule exceeds about 5% by weight, X-ray diffraction equipment can be used to quantify the collected samples using standard addition method or internal standard addition method. However, quantification may not be possible for samples with less than the above content.
At this point, as a pretreatment method that only dissolves the substrate components of the sample, formic acid pretreatment is implemented, and then quantitative analysis is performed using X-ray diffraction equipment with substrate standard absorption correction method.
In the qualitative and quantitative analysis of asbestos, an X-ray diffraction device XRD-6000 environmental measurement kit equipped with a substrate standard absorption correction method for environmental measurement sample stage can also be used.

Diffraction patterns of various asbestos materials

Asbestos mainly includes serpentine like chrysotile, amphibole like pyroxene, tiger's eye stone, etc. Use X-ray diffraction to perform quantitative analysis by characterizing their characteristic peaks.