TISKEN MIRA Universal Analytical High Resolution Field Emission Scanning Electron Microscope

TISKEN MIRA Universal Analytical High Resolution Field Emission Scanning Electron MicroscopeEquipped with a high brightness Schottky field emission electron gun, in TESCAN Essence ™ SEM imaging and real-time elemental analysis were implemented in the same window of the operating software. This combination greatly simplifies the process of obtaining morphology and elemental data from samples, making MIRA an effective analytical solution for quality control, failure analysis, and laboratory routine material testing.

Outstanding features

Fully integrated TESCAN Essence ™ EDS analysis platform, available in Essence ™ Implement SEM imaging and real-time elemental analysis in the same window of the software;

TESCAN's unique aperture free optical path design and real-time electron beam tracking technology ™)， Quickly obtainable imaging and analysis conditions;

Unique Wide Field Optics ™） Designed to achieve a minimum magnification of up to 2 times, thus eliminating the need for an additional optical navigation camera to easily navigate the sample;

Standard SingleVac ™ In this mode, non-conductive samples or electron beam sensitive samples can be directly observed without spraying;

Intuitive modular essence ™ Software, regardless of the user's level of experience, can be easily operated;

Essence ™ The 3D anti-collision model ensures the safety of the detector installed in the sample chamber during sample stage and sample movement;

The optional SE and BSE detectors inside the lens barrel, as well as the electron beam deceleration technology, better improve the imaging performance under low voltage;

Standard analysis platform, with the option to integrate the most types of detectors and accessories (such as cathode fluorescence detectors, water-cooled backscattered electron detectors, etc.).