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Small film thickness monitoring device
Brief introduction: Suitable for thin film measurement of resistance thermal evaporation, electron beam evaporation, magnetron sputtering and other eq
Product details
Details introduction:
Small film thickness monitoring device
1、 Technical features:
1Provide dedicated software to obtain complete sedimentary data through computer operation and display, and be able to save the displayed relevant data;
2Using computersUSBInterface communication and power supply, easy to install;
3Compact size, does not occupy space in the electrical control cabinet;
2、 Application scope:
Suitable for thin film measurement of equipment such as resistance thermal evaporation, electron beam evaporation, magnetron sputtering, etc., operated and controlled by computers (industrial control computers).
IIIMain parameters:
CY-FTM106-Y film thickness monitor
crystal frequency
6MHz
Operation and display mode
Through computer operation and display
Thickness display range
0-99μ9999Å
Thickness display resolution
1Å
Speed display range
0-9999.9Å
Rate display resolution
0.1Å/s
Coating layers
99th floor
Probe input
2 options (choose one job)
Tool factor
0.01-99.99
Material storage
257 types
Communication and power supply
USB interface
damper control
Computer programming implementation
Chassis size
100×65×45mm
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