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Product details
- High power 600W monochromatic Al K α X-ray source ensures high analytical sensitivity
- A double-layer energy analyzer with an average radius of 165mm ensures high energy resolution XPS analysis and high spatial resolution XPS imaging
- The patented immersion magnetic lens technology significantly improves analysis sensitivity
- The fast parallel X-ray photoelectron real-time imaging of the patent has a spatial resolution of better than 3 μ m and a maximum pixel of 65536 (256 × 256), which can perform micro area element and chemical state spatial distribution analysis
- The patented coaxial ultra-low energy shadowless single electron source charge neutralizer perfectly solves the XPS analysis of insulators
- The patented two-dimensional array delay line detector can simultaneously record the intensity and emission position of photoelectrons, enabling the acquisition of high-energy resolution XPS spectra within seconds
- Fully automatic sample stage, capable of analyzing large samples of 100mm × 100mm
- Energy resolution better than 0.45eV (Ag 3d5/2)
- Conventional analysis with high energy resolution and sensitivity 0.55eV@1.1Mcps （Ag 3d5/2）
- The analysis energy resolution and sensitivity of insulator analysis are as high as 0.68eV@16kcps (C 1s of PET)
- Optional monochromatic Al/Ag dual anode X-ray source for high-energy XPS analysis
- The Vision software, which combines data collection and processing, can run on various platforms such as Windows XP/Vista/7, achieving powerful functions such as real-time display of vacuum degree in each vacuum chamber, control of vacuum valve opening and closing, experimental condition setting, and fully automatic unmanned analysis
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