Instrument Introduction:

The crystallization of more than 20 years of technological accumulation and development is a classic ellipsometer model with high accuracy, sensitivity, and stability. Even on transparent substrates, the most accurate measurements can be made on ultra-thin films. Adopting PEM phase modulation technology can provide better stability and signal-to-noise ratio compared to mechanical rotating component technology.

Technical parameters:

Optional spectral range:

*UVISEL Extended Range (190nm-2100 nm)

*UVISEL NIR (250 nm -2100 nm)

*UVISEL VIS (210 nm -880 nm)

*UVISEL FUV (190 nm -880 nm)

*UVISEL VUV (142 nm -880 nm)

*Multiple practical options for micro spot size

*Detector: Provides optimized PMT and IGA detectors for UV, visible, and near-infrared, respectively

*Automatic sample table size: Multiple sample tables to choose from

*Automatic protractor: Variable angle range of 35 ° -90 °, fully automatic adjustment, minimum step size of 0.01 °

Main features:

*50KHz high-frequency PEM phase modulation technology, measuring no moving parts in the optical path

*Having the measurement accuracy required for ultra-thin films and the high spectral resolution required for ultra-thin films

*Equipped with millisecond level ultra fast dynamic acquisition mode, it can be used for online real-time monitoring

*Various accessories such as automatic platform sample scanning imaging, variable temperature stage, electrochemical reaction cell, liquid cell, sealing cell, etc

*Flexible configuration