Brooke's Hysitron TS 75 TriboScope nanoindentation instrument provides quantitative, rigid probe nanoindentation and nanofriction characterization capabilities for the field of atomic force microscopy. Hysitron TriboScope is used in conjunction with Bruker's Dimension ICON, Dimension Edge, and MultiMode 8 to expand the characterization capabilities of these microscopes. By utilizing rigid testing probes, TriboScope eliminates the inherent limitations, variability, and complexity associated with cantilever based measurements, providing quantitative and reproducible mechanical and frictional properties at the nanometer to micrometer scale.

Advantages of rigid probes

Most atomic force microscopes (AFM) use appropriate cantilevers for mechanical or tribological testing, posing significant challenges in separating the elasticity and rotational stiffness of cantilevers from the material's response to applied stress. TriboScope uses a rigid test probe assembly that allows for direct control and measurement of applied forces and displacements during testing.

Exclusive electrostatic drive

TriboScope utilizes proprietary electrostatic drive and capacitive displacement sensing sensor technology to provide industry-leading noise levels and low thermal drift, thereby describing performance to the nanoscale limit.

Force and displacement feedback control

TriboScope operates under closed-loop force control or displacement control. TriboScope utilizes a 78 kHz feedback loop rate to respond to rapid material deformation transient events and faithfully reproduce operator defined testing functions.