Hitachi UV/Vis/NIR spectrophotometer UH4150

Product Introduction

On the basis of the solid analysis spectrophotometer expert U-4100, further technological improvements have been achieved, and UH4150 has been launched!

UH4150 is an expert in integrating sphere spectrophotometers, which is the most suitable for studying the spectral performance of semiconductors, optical components, and new materials. It is the most powerful spectrophotometric system in terms of functionality. UH4150 is the most high-performance system suitable for testing solid, liquid, and turbid samples.

Technical Specifications:

Technical features:

(1) Switching the detector wavelength will result in small signal differences, but even so, UH4150 can achieve high-precision measurements.

Due to the use of Hitachi's professional integrating sphere structure technology and signal processing technology, the changes in absorbance values during detector switching (differences in signal levels) are minimized to the greatest extent possible.

(2) Hitachi's high-performance prism grating dual monochromator system can achieve low stray light and low polarization.

Compared with common grating grating (G-G) systems, the prism grating (P-G) system does not show significant changes in the intensity of S and P polarized light. Even for samples with low transmittance and reflectivity, UH4150 can achieve low-noise measurements.

(3) Parallel beams can achieve precise measurement of reflected and scattered light.

Parallel beam, with the same incident angle relative to the sample, achieves high-precision measurement of specular reflectance. In addition, parallel beams can be used for evaluating diffusion rate (haze) and measuring lens transmittance.

(4) Multiple detectors suitable for different measurement purposes can be provided.

Integrating spheres with eight different materials, sizes, and shapes can be used

(5) Adopting a brand new ergonomic design.

Improve the sample room door and enhance operability. In order to facilitate the replacement of samples and accessories, an ergonomic design has been adopted.

(6) Compatible with multiple U-4100 attachments.

The universal attachment is applicable to two models. The U-4100 attachment can also be used on the UH4150 due to its detachable nature, making it suitable for a wider range of measurement types.

(7) Higher sample flux than U-4100 model.

The UH4150 model can be measured at intervals of 1 nm at a scanning speed of 1200 nm/min, significantly reducing the measurement time.

Application fields:

Suitable for liquids, turbid liquids, and solids. It can achieve non-destructive testing of absorption/transmittance/reflectance of various optical and electronic equipment materials, including powders, glass, optical films, film materials, lenses, prisms, single crystal wafers, liquid circuit boards, etc. Widely used in the study of spectral properties of semiconductors, optical components, optoelectronic devices, and new materials, obtaining spectral data such as absorption, total transmission, normal transmission, diffuse transmission, total reflection, normal reflection, and diffuse reflection of samples.