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Hitachi FlexSEM 1000 scanning electron microscope
Hitachi FlexSEM 1000 scanning electron microscope
Product details
- Compact design with a resolution of 4 nm * 1
- High sensitivity secondary electron detector, backscatter detector, and low vacuum detector (UVD * 2) are used to achieve high-quality image observation under low acceleration voltage/low vacuum conditions
- Easy to operate, even beginners can take high-quality pictures
- The newly developed navigation function 'SEM MAP' facilitates quick locking of the field of view
- Large window (30 mm2) SDD spectroscopy system for rapid analysis of elemental composition * 2
*2 optional options
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