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HIOKI3504-50 Japanese capacitance tester
We specialize in providing Japanese HIOKI3504-50 capacitance tester equipment, testing solutions, technical training, maintenance and measurement serv
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Professional Instrument Equipment and Testing Solution Supplier - JETYOO Industrial&Jianyou (Shanghai) Measuring Instrument Co., LtdFounded in 2011 by Jian JET, a product technical support engineer for Agilent (now known as KEYSIGHT), and Rong YOO, a product technical support engineer for KEITHLEY (now known as Tektronix)Characterized by technological applicationsThe agency trading company,Focused on the industrial testing industry for 16 yearsAiming to break through the old and establish the new! Fill the gap of most imported instrument and equipment manufacturers only setting up sales points in China, but with weak or no technical support, and agent distributors only specialize in sales, not professional in pre-sales technical Q&A/testing plans, and not professional in after-sales training/maintenance calibration.
HIOKI3504-50 Japanese capacitance testerAccording to the measurement purpose, different models have different probe/test fixture options
SMD test fixture 9699, used for SMD DC~120MHz with electrodes at the bottom, test sample size: width 1.0~4.0mm, height below 1.5mm
SMD test fixture 9677, used for SMD DC~120MHz with electrodes on the side, test sample size: 3.5mm ± 0.5mm
SMD test fixture 9263, direct connection type, DC~5 MHz test size: 1mm~10.0mm
Test fixture 9262, DC～8 MHz, Direct connection type
Test fixture 9261 cable connection type, DC~5 MHz, 1m long
Tweeze shaped probe L2001, wire length 73cm, DC~8MHz, 50 Ω, front electrode spacing: 0.3-6mm (IM9901: JIS size 1608-5750) (IM9902: JIS size 0603-5750)
4-terminal test probe 9140, DC~100kHz, 1m long
SMD test fixture 9677, used for SMD DC~120MHz with electrodes on the side, test sample size: 3.5mm ± 0.5mm
SMD test fixture 9263, direct connection type, DC~5 MHz test size: 1mm~10.0mm
Test fixture 9262, DC～8 MHz, Direct connection type
Test fixture 9261 cable connection type, DC~5 MHz, 1m long
Tweeze shaped probe L2001, wire length 73cm, DC~8MHz, 50 Ω, front electrode spacing: 0.3-6mm (IM9901: JIS size 1608-5750) (IM9902: JIS size 0603-5750)
4-terminal test probe 9140, DC~100kHz, 1m long
HIOKI3504-50 Japanese capacitance testerBasic parameters
Measurement parameters Cs, Cp (capacitance), D (loss coefficient tan δ)
measuring range C:0.9400pF～20.0000mF，D:0.00001～1.99000
Basic accuracy (Representative values) C: ± 0.09% rdg. ± 10 dgt., D: ± 0.0016, measurement accuracy=basic accuracy x B x C x D x E, where B to E are coefficients
Measurement Frequency 120Hz, 1kHz
Measure signal level Constant voltage mode: 100mV (limited to 3504-60), 500 mV, 1 V
Measurement range:
CV 100mV: Range of~170 μ F (measurement frequency 1kHz), Range of~1.45mF (measurement frequency 120Hz)
CV 500mV: Range of~170 μ F (measurement frequency 1kHz), Range of~1.45mF (measurement frequency 120Hz)
CV 1V:~70 μ F range (measurement frequency 1kHz),~700 μ F range (measurement frequency 120Hz)
output resistance 5 Ω (in open circuit terminal voltage mode outside the CV measurement range)
display Light emitting diode (6-digit representation, full range calculator depends on the range)
Time Typical value: 2.0 ms (1 kHz, FAST) Measurement time varies depending on the measurement frequency and speed
function BIN classification measurement (excluding 3504-40), triggering synchronous output, measurement condition memory, measurement value comparison function, average value function, Low-C filtering function, vibration function, control output input (EXT. I/O), RS-232C interface (standard), GP-IB interface (excluding 3504-40)
power supply AC 100/120/220/240V ± 10% (optional), 50/60Hz, maximum 110VA
Volume and weight 260W × 100H × 220Dmm, 3.8kg
attachment Power cord x 1, backup power fuse x 1, user manual x 1
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