German Mal roughness profilometer
German Mahr roughness profilometer
German Mar XCR20 roughness profilometer
German Mahr XCR20 roughness profiler

German MAR SURF XCR20 roughness profiler
High performance dual driver roughness and contour integrated measuring instrument

The German MarSurf XCR 20 roughness profilometer is a new generation of combined surface roughness and contour measuring instrument
Integrated with mature roughness measuring instrument XR20 and contour measuring instrument XC20 functions, the instrument has a compact structure and excellent performance
Suitable for measuring any complex and diverse part!

The advantages and characteristics of the German MARSURF XCR20 roughness profiler
1) MARSURF XCR20 roughness profilometer equipment
MARSURF XCR20 roughness profilometer is a new generation of combined surface roughness and contour measuring instrument
This instrument integrates mature roughness measuring instrument XR20 and contour measuring instrument XC20 functions. The instrument has a compact structure and excellent performance, making it a reliable assistant for your daily testing.

MarSurf XC20 contour measuring instrument+MarSurf XR20 roughness measuring instrument=MarSurf XCR20 roughness contour measuring instrument
·MarSurf XCR20 roughness profiler features:
-Save space and position, both types of driver units are suitable for installation in ST500 and ST 750 measurement stations.
-Dual drives, independent of each other, taking into account the requirements of all parties
-Can evaluate high-precision contours and roughness

-MarSurf XCR20 integrates two drive units (PCV20 and GD 25) into one device
-The MarSurf LD120 series equipment can provide higher precision contour and roughness measurement evaluation for products
·The standard configuration of MarSurf XCR20 roughness profiler includes:
XCR20device host
PCV200 Profile Driver
GD25 roughness driver
MFW-250 sensor
MCP-23 standard control box
Calibration Standard for contour calibration
Combination Mount PCV200/GD25 Fixed Fixture
Measuring Stand with 700 X 550mm marble
Measurement workbench ST500 of the platform
X/Y-table CT200 CT200 X-Y worktable
PC and Standard Contro PC and Main Control Unit
2) MarSurf XCR20 roughness profile measurement driver PCV200 and GD25
·MarSurf XCR20 contour measurement driver PCV200

-Automatic lifting or lowering of the measuring arm, with adjustable speed
-X-axis 200mm wide scanning length
-Z-axis 50mm detection range
-Measure force from 1 mN to 120 mN, set by software control to adapt to different workpiece materials being measured
-The patented arm clamping device does not require any tools for replacement and can be replaced repeatedly
-Implement segmented measurement through programming
-Dual measuring needles can be optionally selected to achieve forward and reverse contour measurement.
·MarSurf XCR20 roughness profilometer measurement driver GD2

-Built in reference surface, low vibration design, compact structure, sturdy and durable, and an outer shell that is not easily deformed. The base is equipped with a V-shaped block, electrically driven to raise and lower the measuring head, and automatically set the zero position.
-Suitable for non slider probes and M-type, R-type single slider or double slider probes. It can also be used in conjunction with MFW 250 and RFHTB slide free probes to record roughness, waviness, and contour deviation. The universal housing design makes it suitable for handheld, desktop, and workbench measurements. Measurements can also be taken in horizontal, vertical, and inverted directions.
-This driver can be used for measurement in pipelines and holes. The entire driver can be inserted into a hole with a diameter of not less than 68 mm (2.68 in) for measurement. For smaller holes, only the probe protection part can be inserted for measurement.
-By using a tilt adjustment thread to adjust the reference plane, the electrically driven height adjuster readjusts the probe to ensure that the needle tip automatically remains at the center position of the measurement range.
-Specially designed probe connection method enables quick replacement of probes while protecting sensor safety.

MarSurf XCR20 roughness profiler standard configuration

MARSUFT XCR20 roughness profiler accessory
1) MarSurf XCR20 calibration and standard parts
An excellent calibration method is a necessary guarantee for ensuring the long-term stability of instrument accuracy. As a professional metrology equipment supplier with over 150 years of history, Mahr has a mature calibration scheme for our professional metrology instruments.
The Mal XCR20 roughness profile measuring instrument is equipped with scientific calibration methods for different measurement functions.
2) Calibration method for roughness measurement system

·PGN Multi line Template
The PGN series multi line template is made of glass as the base material and engraved with a standard sine depth curve profile, used for dynamic calibration of roughness measurement systems.
-PGN 1 standard block order number 6820602
-PGN 3 standard block order number 6820601
-PGN 10 standard block order number 6820605

·PEN single engraved line template
There are single engraved lines with a depth of about 10 microns on the PEN single engraved line template, which are used for static calibration of the roughness measurement system.
PEN 10-1 Order Number 6820101

·PRN 10 Metal Multi line Template
PRN 10 metal multi line template with a contour depth of approximately 10 microns, used for dynamic calibration of roughness measurement systems.
PRN 10 Order Number 6820420
3) Calibration method for contour measurement system

·In XCR20 software, not only the geometric parameters of the measuring needle are calibrated, but also the force and deformation of the measuring rod are calibrated comprehensively to ensure the accuracy and reliability of the measurement results.

·Calibration standard for geometric parameters of measuring needles

·Contour standard KN1000

MARSURFXCR 20 roughness profilerTechnical parameters
1) MarSurf XCR 20 contour measurement driver PCV200 Technical Parameter

2) MarSurf XCR20 roughness measurement driver GD25 Technical Parameter