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Fully automatic 3D measuring desktop computer
**/Tilt the optical head to measure surface features at different angles while minimizing tracking errors. *Advanced user interface, providing intuiti
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The CONTITX-500 optical profilometer is the world's most advanced automated desktop system used for fast, non-contact 3D surface measurement. The Contracx-500, with its measuring capabilities, boasts * * * * Z-axis resolution and accuracy, and offers all industry recognized advantages of Bruker's White Light Interferometry (WLI) floor standing model in a smaller footprint. This profilometer is easy to customize and suitable for a wide range of complex applications, from QA/QC metrology of precision machined surfaces and semiconductor processes to the development characteristics of ophthalmic and MEMS devices.
Designed for Benchtop Metrology in * * * *
Bruker's proprietary * */head tilt provides * * * user flexibility for production settings and inspections. By coupling the automatic * */tilt function with the optical path in the microscope lens, Bruker couples the detection point to a line of sight that is independent of tilt. This reduces the intervention of operators and provides maximum reproducibility. Other hardware features include a stage design with greater splicing capability and a 5MP camera with a 1200x1000 measurement array to reduce noise, a larger field of view, and higher lateral resolution. The combination of these features with automated staging and objectives makes the Contracex-500 highly suitable for "value on demand" research and industrial metrology, all within a compact footprint.
Simplify access to extensive analysis
With thousands of customized analyses and Bruker's easy-to-use yet powerful VisionXpress ™ With the VI 64 user interface, the Con Arc X-500 has been optimized for production efficiency in both laboratories and factories. Bruker's new Universal Scanning Interferometer (USI) measurement mode provides fully automated, self sensing surface textures, optimized signal processing, as well as accurate and realistic calculations of the surface morphology being analyzed.
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