The E5000 has a high-power CNC arc light source, a fully automatic laser alignment light source device, a stable and reliable Paschen Runge full spectrum spectroscopic system, and array CCD full spectrum measurement technology. It also combines timing analysis, spectral automatic correction, and adopts the method of direct injection of solid samples. Comprehensively solved the problems of tedious and inefficient analysis in traditional technology. The E5000 emission spectrometer has the advantages of simultaneous analysis of multiple elements in the full spectrum, fast analysis speed, and good stability, achieving a certain level of analytical performance.

Combining arc emission spectroscopy technology with full spectrum direct reading spectroscopy technology, solid powder analysis technology
Paschen Runge full spectrum optical system, capable of measuring all conventional elements that need to be analyzed
Compact small desktop design ensures stability, reliability, ease of use, and convenience
Anti overflow CCD high-speed data acquisition system with high signal-to-noise ratio and large dynamic range
High power CNC programmable light source, with controllable current, voltage, and frequency, providing better analysis methods
Multiple chains and monitoring to ensure safe and reliable operation
● Fully automatic electrode laser alignment system
Direct injection of powder samples, convenient and rapid
One click activation, immediately obtain analysis results
Built in working curve, customers do not need to manually build lines, effectively improving work efficiency
● Open advanced software features to provide customers with a method development platform

Product application:

Full spectrum measurement technology
The full spectrum platform has rich spectral line information, making it easier to expand elements and develop methods
Based on full spectrum measurement data, it is possible to correctly distinguish between background and spectral lines, effectively improving measurement accuracy
-Convenient for viewing spectral lines and interference conditions
-Support different deduction methods such as oblique background, left and right background, etc
Powerful automatic spectral line interference removal algorithm
-Obtain clean spectral lines to be analyzed by subtracting interference spectral lines through algorithms
-Multi peak fitting technology based on full spectrum measurement data can completely separate spectral lines and effectively eliminate interference from spectral lines
Select different analysis spectral lines based on the range of element content, for more accurate measurements in large content ranges
-Combining multiple spectral lines expands the analysis range while effectively ensuring analysis accuracy
-Avoid saturation of sensitive lines, no need to release samples, and achieve a larger analysis range