Product advantages:

In situ online characterization of paraxial optical path

The high collection efficiency and durable quality brought by the seamless design

Compact design suitable for the confined space of synchrotron radiation line stations

Fully automated remote control

Additional characterization options for scientific engineering selection

BeamLIGHT is the perfect choice for in-situ source characterization in beamline stations. It integrates a compact slit free spectrometer (50 centimeters long). This architecture greatly improves the reliability of daily operations. BeamLIGHT combines the highest spectrometer efficiency with aberration correction, flat field coverage, and automatic beam side axis switching. Modular design matches various experimental architectures and configurations. Standard and ultra-high vacuum versions are available. Beam diagnostic functions such as spot profiling instruments or wavefront sensors can be added. The detector options include XUV CCD camera and MCP components. We accept fully customized beamline settings and in-situ online spectrometers. Please contact us to discuss your requirements.

　　Technical parameters:

　　Typical applications

High harmonic generation source;

A-second science;

Strong laser matter interaction;

Plasma sources generated by lasers and discharges;

Characterization of synchrotron beamlines;

Free electron laser;

X-ray laser;

Laser driven secondary source